Committee login






Small thumbnail

Nonlinear Theory of Elastic Plates

Small thumbnail

Exterior Algebras

Elementary Tribute to Grassmann's Ideas

Small thumbnail

From Pinch Methodology to Pinch-Exergy Integration of Flexible Systems

Thermodynamics Energy, Environment, Economy Set

Small thumbnail

Data Treatment in Environmental Sciences

Multivaried Approach

Small thumbnail

Gas Hydrates 1

Fundamentals, Characterization and Modeling

Small thumbnail

Smart Decisions in Complex Systems

Small thumbnail

Chi-squared Goodness-of-fit Tests for Censored Data

Stochastic Models in Survival Analysis and Reliability Set Volume 3

Small thumbnail

Baidu SEO

Challenges and Intricacies of Marketing in China

Small thumbnail

Supply Chain Management and Business Performance

The VASC Model

Small thumbnail

Asymmetric Alliances and Information Systems

Issues and Prospects

Small thumbnail

X-ray Diffraction by Polycrystalline Materials

Instrumentation and Microstructural Analysis

René Guinebretière, ENS de Céramiques Industrielles, Limoges, France

ISBN: 9781905209217

Publication Date: March 2007   Hardback   376 pp.

215.00 USD

Add to cart


Ebook Ebook


This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.


1. Kinematic and geometric theories of X-ray diffraction.
2. Instrumentation used for X-ray diffraction.
3. Data processing, extracting information.
4. Interpreting the results.
5. Scattering and diffraction on imperfect crystals.
6. Microstructural study of randomly oriented polycrystalline samples.
7. Microstructural study of thin films.

About the Authors

René Guinebretière is a senior lecturer at the Ecole Nationale Supérieure de Céramique Industrielle in Limoges, France, and teaches X-ray diffraction. His research activities are the study of materials through X-ray diffraction within the SPCTS International Laboratory in France.


DownloadTable of Contents - PDF File - 152 Kb

DownloadSample Chapter - PDF File - 801 Kb

Related Titles

0.02623 s.