Edited by
Jean-Michel André, Université Pierre et Marie Curie, France.
Philippe Jonnard, LCPMR, France.
ISBN : 9781789451870
Publication Date : February 2025
Hardcover 270 pp
165.00 USD
Co-publisher
The artificial Bragg structures (ABS) studied in this book have revolutionized X-ray optics. They are based on (quasi-) periodic stacks of nanoscale thin films with periods close to the wavelength of the radiation.
X-ray Radiation and Artificial Bragg Structures presents the historical prolegomena relating to X-ray sources and the initial development of ABS. It analyzes the modeling of ABS characteristics and performance, and their optimization. It also presents matrix and recursive methods, coupled-wave theory and scattering theory.
This book also examines ABSs as seats for special quantum and magneto-optic phenomena. It discusses the application of ABSs, as well as promising developments in EUV lithography and the realization of new X-ray sources. Finally, it presents the prospects offered by ABSs in the near future, particularly in the field of coherent sources and X-ray lasers.
1. Historical Prolegomena, Jean-Michel André and Philippe Jonnard.
2. Propagation of X-ray Radiation in a Bragg Structure: Frequency Domain, Jean-Michel André and Philippe Jonnard.
3. Coupled-wave Theories, Jean-Michel André and Philippe Jonnard.
4. Propagation in Hybrid Bragg Structures: Scattering Theory, Jean-Michel André and Philippe Jonnard.
5. Optimization and Design of Artificial Bragg Mirrors, Jean-Michel André and Philippe Jonnard.
6. Physics of Artificial Bragg Structures: Presentation of Some Phenomena, Jean-Michel André, Karine Le Guen and Philippe Jonnard.
7. Applications of Artificial Bragg Structures, Jean-Michel André, Karine Le Guen and Philippe Jonnard.
8. Perspectives and Conclusion, Jean-Michel André and Philippe Jonnard.
Jean-Michel André holds a doctorate in engineering from the Université Pierre et Marie Curie, France. He is a former CNRS engineer and, in 2011, was awarded the instrumentation prize of the Société française de physique and the Société chimique de France.
Philippe Jonnard is CNRS Research Director at LCPMR, France. He is a specialist in X-ray spectroscopy, and studies the stacking of nanometric thin films using innovative X-ray methods.
