Advanced Laser Diode Reliability

Durability, Robustness and Reliability of Photonic Devices SET Coordinated by Yannick Deshayes

Advanced Laser Diode Reliability

Edited by

Massimo Vanzi, University of Cagliari, Italy
Laurent Béchou, University of Bordeaux, France
Mitsuo Fukuda, Toyohashi University of Technology, Japan
Giovanna Mura, University of Cagliari, Italy

ISBN : 9781785481543

Publication Date : July 2021

Hardcover 268 pp

120.00 USD



Modern research into laser diodes is exciting and still evolving. It has revealed that light interaction with matter introduces new physical phenomena in both the operation and failure mechanisms of these technologies.

Combining the research of four teams of researchers from three different continents, this book is split into five chapters. Chapter 1 studies degradation mechanisms from a physical point of view. Chapter 2 investigates the challenging problem of modeling the effect of multiple interacting mechanisms. Chapter 3 describes an approach based on the Monte Carlo method to predict lifetime and failure rate of laser diodes operating in high-rate optical fiber links. Chapter 4 presents a model for reading the DC characteristics of a laser diode. Finally, Chapter 5 summarizes a large set of procedures for measuring parameters.

This book is intended to be a valuable tool for those wishing to read performances and possible failures of laser diodes as well as for those applying practical innovative procedures to predict long-term reliability.


1. Laser Diode Reliability, Mitsuo Fukuda and Giovanna Mura.
2. Multi-Component Model for Semiconductor Laser Degradation, Samuel K. K. Lam and Daniel T. Cassidy.
3. Reliability of Laser Diodes for High-rate Optical Communications – A Monte Carlo-based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions, Laurent Mendizabal, Frédéric Verdier, Yannick Deshayes, Yves Ousten, Yves Danto and Laurent Béchou.
4. Laser Diode Characteristics, Massimo Vanzi.
5. Laser Diode DC Measurement Protocols, Massimo Vanzi, Giovanna Mura, Laurent Béchou, Giulia Marcello and Valerio Sanna Valle.

About the authors/editors

Massimo Vanzi is Full Professor of Electronics at the University of Cagliari, Italy. Previously, he worked for 14 years at the Italian telecom company, Telettra, in the Quality and Reliability Department. His research focuses on general reliability, failure physics and diagnostics of solid state devices.

Laurent Béchou is Full Professor in Electronics and Physics at the University of Bordeaux, France, and Visiting Senior Researcher at the Laboratoire Nanotechnologies et Nanosystèmes (CNRS) at the University of Sherbrooke, Canada. His research mainly addresses advanced electro-optical characterization techniques, physical and failure mechanisms modeling, as well as statistical methods for lifetime prediction of optical devices and emerging photonic systems.

Mitsuo Fukuda is Senior Researcher and Professor Emeritus studying plasmonic devices at the Toyohashi University of Technology, Japan. Previously, he was a researcher studying optical semiconductor devices used for various optical fiber communication systems at the NTT Electrical Communication Laboratories.

Giovanna Mura is Assistant Professor at the University of Cagliari. Her research is mainly focused on failure physics, diagnostics of microelectronics by electron microscopy (SEM and TEM) and general methods for reliability with a special emphasis on photonic devices.

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