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Secure Connected Objects

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Banach, Fréchet, Hilbert and Neumann Spaces

Analysis for PDEs Set – Volume 1

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Semi-Markov Migration Models for Credit Risk

Stochastic Models for Insurance Set – Volume 1

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Human Exposure to Electromagnetic Fields

From Extremely Low Frequency (ELF) to Radio Frequency

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Enterprise Interoperability


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Data Treatment in Environmental Sciences

Multivaried Approach

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From Pinch Methodology to Pinch-Exergy Integration of Flexible Systems

Thermodynamics – Energy, Environment, Economy Set

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Exterior Algebras

Elementary Tribute to Grassmann's Ideas

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Nonlinear Theory of Elastic Plates

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Cognitive Approach to Natural Language Processing

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Nanometer-scale Defect Detection Using Polarized Light

Reliability of Multiphysical Systems Set – Volume 2

Pierre Richard Dahoo, University of Versailles Saint-Quentin, France Philippe Pougnet, Vedecom Institute, Versailles, France Abdelkhalak El Hami, Institut National des Sciences Appliquées (INSA-Rouen), France

ISBN: 9781848219366

Publication Date: August 2016   Hardback   316 pp.

125.00 USD

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This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties.
The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.


1. Uncertainties.
2. Reliability-based Design Optimization.
3. The Wave–Particle Nature of Light.
4. The Polarization States of Light.
5. Interaction of Light and Matter.
6. Experimentation and Theoretical Models.
7. Defects in a Heterogeneous Medium.
8. Defects at the Interfaces.
9. Application to Nanomaterials.

About the Authors

Pierre Richard Dahoo is Professor at the University of Versailles Saint-Quentin in France. His research interests include absorption spectroscopy, laser-induced fluorescence, ellipsometry, optical molecules, industrial materials, modeling and simulation. He is program manager of the Chair Materials Simulation and Engineering of UVSQ.
Philippe Pougnet is a Doctor in Engineering. He is an expert in reliability and product-process technology at Valeo and is currently working for the Vedecom Institute in Versailles, France. He is in charge of assessing the reliability of innovative power electronic systems.
Abdelkhalak El Hami is Professor at the Institut National des Sciences Appliquées (INSA-Rouen) in France and is in charge of the Normandy Conservatoire National des Arts et Metiers (CNAM) Chair of Mechanics, as well as several European pedagogical projects.


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