X-Rays and Materials
Publication Date: March 2012 Hardback 240 pp.
This book presents reviews of various aspects of radiation/matter interactions, be these instrumental developments, the application of the study of the interaction of X-rays and materials to a particular scientific field, or specific methodological approaches. The overall aim of the book is to provide reference summaries for a range of specific subject areas within a pedagogical framework. Each chapter is written by an author who is well known within their field and who has delivered an invited lecture on their subject area as part of the “RX2009 – X-rays and Materials” colloquium that took place in December 2009 at Orsay in France. The book consists of five chapters on the subject of X-ray diffraction, scattering and absorption. Chapter 1 gives a detailed presentation of the capabilities and potential of beam lines dedicated to condensed matter studies at the SOLEIL synchrotron radiation source. Chapter 2 focuses on the study of nanoparticles using small-angle X-ray scattering. Chapter 3 discusses the quantitative studies of this scattering signal used to analyze these characteristics in detail. Chapter 4 discusses relaxor materials, which are ceramics with a particularly complex microstructure. Chapter 5 discusses an approach enabling the in situ analysis of these phase transitions and their associated microstructural changes.
1. Synchrotron Radiation: Instrumentation in Condensed Matter, Jean-Paul Itie, François Baudelet, Valérie Briois, Eric Elkaim, Amor Nadji and Dominique Thiaudiere.
2. Nanoparticle Characterization using Central X-ray Diffraction, Olivier SPALLA.
3. X-ray Diffraction for Structural Studies of Carbon Nanotubes and their Insertion Compounds, Julien Cambedouzou and Pascale Launois.
4. Dielectric Relaxation and Morphotropic Phases in Nanomaterials, Jean-Michel Kiat.
5. Evolution of Solid-state Microstructures in Polycrystalline Materials: Application of High-energy X-ray Diffraction to Kinetic and Phase Evolution Studies, Elisabeth Aeby-Gautier, Guillaume Geandier, Moukrane Dehmas, Fabien Bruneseaux, Adeline Beneteau, Patrick Weisbecker, Benoît Appolaire and Sabine Denis.
About the Authors
Philippe Goudeau is director of research at CNRS and head of the thin film mechanical properties team at the PHYMAT laboratory in Poitiers in France. His research concerns the study of size effects on the mechanical properties of thin films by X-ray diffraction in laboratory and on synchrotron sources.
René Guinebretière is Professor at ENSCI in Limoges, France. He teaches X-ray diffraction and materials physics. He carries out research into the development and characterization of oxide nanomaterials by
X-ray diffraction at the SPCTS laboratory associated with CNRS.