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Reliability Investigation of LED Devices for Public Light Applications

Durability, Robustness and Reliability of Photonic Devices Set

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Aerospace Actuators 2

Signal-by-Wire and Power-by-Wire

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Flash Memory Integration

Performance and Energy Considerations

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Mechanics of Aeronautical Solids, Materials and Structures

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Engineering Investment Process

Making Value Creation Repeatable

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Space Strategy

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Distributed Systems

Concurrency and Consistency

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Fatigue of Textile and Short Fiber Reinforced Composites

Durability and Ageing of Organic Composite Materials Set – Volume 1

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Management of the Effects of Coastal Storms

Policy, Scientific and Historical Perspectives

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Computational Color Science

Variational Retinex-like Methods

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Transverse Disciplines in Metrology

Proceedings of the 13th International Metrology Congress, 2007 – Lille, France

Edited by French College of Metrology

ISBN: 9781848210486

Publication Date: February 2009   Hardback   832 pp.

385.00 USD

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The 2007 International Metrology Congress was organized by the French College of Metrology in collaboration with the Laboratoire National de Métrologie et d’Essais (LNE) and the scientific support of the Nederlands Meetinstituut (NMI), the national metrology institute of the Netherlands.
These proceedings are a selection of conferences covering:
– the evolution of metrology, and its applications in industry, environment and safety, health and medicine, economy and quality, and new information and communication technologies;
– the improvement of measurement procedures to guarantee the quality of products and processes;
– the development of metrology linked to innovating technologies.


• Chemistry – Statistics / Gas analysis
• Hydraulic quantities
• Recent developments of the ITS
• The SI, now and tomorrow
• Metrology and health
• Metrological tools and means
• Environment
• Dimensional metrology and uncertainty
• Innovation and knowledge transfer
• Uncertainty
• Sensory metrology
• Electricity
• Legal metrology
• Monte Carlo
• Mass
• Optic – Time frequency
• Statistics
• Overview


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