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Secure Connected Objects

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Banach, Fréchet, Hilbert and Neumann Spaces

Analysis for PDEs Set Volume 1

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Semi-Markov Migration Models for Credit Risk

Stochastic Models for Insurance Set Volume 1

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Human Exposure to Electromagnetic Fields

From Extremely Low Frequency (ELF) to Radio Frequency

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Enterprise Interoperability


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Data Treatment in Environmental Sciences

Multivaried Approach

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From Pinch Methodology to Pinch-Exergy Integration of Flexible Systems

Thermodynamics Energy, Environment, Economy Set

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Exterior Algebras

Elementary Tribute to Grassmann's Ideas

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Nonlinear Theory of Elastic Plates

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Cognitive Approach to Natural Language Processing

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Reliability, Robustness and Failure Mechanisms of LED Devices

Durability, Robustness and Reliability of Photonic Devices Set

Yannick Deshayes and Laurent Béchou, University of Bordeaux, France

ISBN: 9781785481529

Publication Date: September 2016   Hardback   172 pp.

110 USD

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The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.
This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed.


1. State-of-the-Art of Infrared Technology.
2. Analysis and Models of an LED.
3. Physics of Failure Principles.
4. Methodologies of Reliability Analysis.

About the Authors

Yannick Deshayes is Associate Professor at the University of Bordeaux, France. His research focuses on the physics of failure, from photonics materials to complex devices. He develops quantum theory to establish degradation laws on photonics devices for LED, laser and photonics applications.
Laurent Béchou is Full Professor at the University of Bordeaux, France.


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